"NANOTECH: Sub-angstrom microscope targets nanotechnology"

A company based here has unveiled what it claims is the highest-resolution scanning-transmission electron microscope.
FEI Co. unveiled the new device at the Microscopy & Microanalysis conference this week in Honolulu. FEI claims its commercial instrument resolves at the sub-angstrom scale for the first time. Designed for nanotechnology development, FEI�s microscope, called the Titan 80-300, enables sub-angstrom (atomic scale) imaging and analysis. Vahe Sarkissian, FEI's chairman and CEO, called the microscope "a significant breakthrough for researchers, developers and manufacturers needing greater access to the nanoscale." Titan will be the platform from which the TEAM effort will develop their new microscope. TEAM (transmission electron aberration-corrected microscopy), is a collaborative project with the U.S. Office of Basic Energy Sciences, which coordinates microscopy efforts between U.S. national laboratories, universities and industry. The Center for Nanophase Materials Sciences Nanoscale Imaging, Characterization, and Manipulation at Oak Ridge National Laboratories is also participating.
Text: http://www.eetimes.com/showArticle.jhtml?articleID=166404246