"SUB-NANO: Adaptive electron scope makes angstrom-scale measures"
Using adaptive optics techniques employed by advanced astronomical telescopes, researchers at IBM Corp.'s Thomas J. Watson Research Center have developed an electron microscope that can make sub-angstrom measurements in finer detail using less power than previous systems.
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Story in EE Times: http://www.eet.com/at/news/OEG20020807S0020