Nanotechnology is challenging our traditional metrological techniques for measuring the purity of a compound, but the National Institute of Standards and Technology (NIST) thinks they have an answer. Look for NIST's new metrological regime to be widely adopted among semiconductor researchers and manufacturers. R. Colin Johnson, Kyoto Prize Fellow @NextGenLog
NIST prepares quartz crystal microbalance disks with samples of carbon nanotubes for microscale thermogravimetric analysis with sample sizes as small as one microgram. Credit: Kar/NIST.
Here is what my story in EETimes says about MEMS resonators: Using a new twist on the traditional thermogravimetric analysis (TGA) technique, the National Institute of Standards and Technology (NIST) demonstrated a new method for taking Nanoscale measurements of the purity of carbon-nanotubes, coated-nanoparticles and surface features on thin films. NIST demonstrated its new TGA microbalance built atop a vibrating quartz crystal, thereby enabling measurements almost 1000-times more sensitive than today...
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