Thursday, January 06, 2011
Colorizing technique shows electrical and material properties of graphene sheets.
Pure sheets of graphene promise to run cooler yet faster than today's silicon chips. Unfortunately defect-free graphene sheets are extremely difficult to grow and even harder to characterize for defects...Cornell University researchers claim to have invented an imaging technique that simplifies their metrology by coloring graphene sheets to quickly identify their properties.
Full Text: http://bit.ly/NexGenLog-f5xP
Posted by R. Colin Johnson at 10:13 AM